Characterisation of Materials is the subject of semester IV of Anna University B.E Material Science And Engineering Syllabus. In this article, we are glad to provide the syllabus of characterisation of materials part of Semester IV Subjects in the first-year course.
We intend to provide the subject code ML3401 – Characterisation of Materials syllabus based on regulation 2021 by Anna University. You can get an idea of the topics in the syllabus of characterisation of materials. We hope that the absolute idea on the syllabus will assist the students in avoiding confusion of revision according to weightage. We also include required textbooks and references. If you require anything regarding the syllabus you can comment in the below section. Hope you like this information. Don’t forget to share.
If you want to know more about the syllabus of B.E. Material Science And Engineering connected to an affiliated institution’s four-year undergraduate degree program. We provide you with a detailed Year-wise, semester-wise, and Subject-wise syllabus in the following link B.E. Material Science And Engineering Syllabus Regulation 2021 Anna University.
Aim Of Objectives:
The main learning objective of this course is to prepare students for:
- Understanding the various techniques of structural characterization of materials.
- Interpreting the microstructure, crystal structure and surface structure of materials.
- On X-Ray diffraction techniques and analysis.
- To import knowledge on different electron microscopy techniques used for characterisation.
- To import knowledge on different electron microscopy techniques used for characterisation.
- To import knowledge on techniques of elemental chemical composition and structure of surface.
ML3401 – Characterisation of Materials Syllabus
Unit – I: Metallographic Techniques
Macro examination -applications, metallurgical microscope – construction and principle of working, specimen preparation, light material interaction – Rayleigh Scattering, Abbes theory; magnification, numerical aperture, resolving power, depth of focus, depth of field, different light sources; lenses aberrations and their remedial measures, Principles of microscopy -bright field , dark field, phase contrast, polarization, differential interference contrast, high-temperature microscopy; Quantitative metallography – Image analysis for grain size distribution and grain/precipitate shape.
Unit – II: X-Ray Diffraction Techniques
Reciprocal lattice, Stereographic projection, X-ray generation, absorption edges, characteristic and continuous spectrum, Bragg’s law, Ewald’s Sphere, Diffraction methods – Laue, rotating crystal and powder methods. Intensity of diffracted beams – structure factor calculations and other factors. Diffractometer – General features and optics, Counters – Proportional, Scintillating, Geiger counters and semiconductor-based.
Unit – III: Analysis Of X-Ray Diffraction
Line broadening-crystallite size, residual stress; Texture Analysis; Crystal structure determination indexing – Phase identification – ASTM catalogue of Materials identification, quantitative phase estimation, Phase diagram determination, Precise lattice parameter calculation, Determination of residual stress – double angle diffraction.
Unit – IV: Electron Microscopy
Electron specimen interaction; Construction and operation of Transmission electron microscope (TEM) – specimen preparation techniques- Diffraction mode and image mode, Sources of contrast Selected Area Electron Diffraction, Zone axis, indexing; Construction, modes of operation and sources of contrast of Scanning electron microscope(SEM), Electron probe microanalysis, Basics of Field ion microscopy (FIB), Scanning Tunnelling Microscope (STM) and Atomic Force Microscope(AFM).
Unit – V: Surface Analysis
X-ray emission spectroscopy – Energy Dispersive Spectroscopy- Wave Dispersive Spectroscopy Ultraviolet Photo Electron Spectroscopy (UPS), X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Electron Energy Analysers, Secondary ion mass spectrometry Quadrupole mass spectrometer; Surface Structure -Unit meshes of five types of surface nets diffraction from diperiodic structures – Low Energy Electron Diffraction (LEED)- Reflection High Energy Electron Diffraction (RHEED).
Text Books:
- Angelo, P.C., “Materials Characterisation”, 1 st Edition Cengage Publication, 2016.
- Cullity, B. D., Stock, S.R. “Elements of X-ray diffraction”, Pearson New International Edition, 3rd Edition, 2014.
References:
- Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA, 1986.
- D. A. Skoog, F. James Leary and T. A. Nieman, “Principles of Instrumental Analysis”, 7th edition, Cengage Learning, 2017.
- Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996.
- Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation “, Ninth Edition, ASM International, USA, 1986.
- Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Hong Kong University of Science and Technology, John Wiley & Sons (Asia) Pte Ltd. 2010.
Related Posts Of Semester – IV:
Must Read: